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Lattices in 3D are oft studied by diffraction
and hence a ``reciprocal-space'' perspective. Today, however,
location as well as diffraction data can be incorporated into
direct space images. From such images the full (or a superset)
lattice of a crystal can be inferred from spacing/orientation
data on three sets of lattice planes not sharing a common zone.
Such data may be obtained from electron-phase or Z contrast
images taken at two tilts, provided that one image shows two
non-parallel lattice periodicities, and the other shows a
periodicity not coplanar with the first two. We discuss here how
to find, and implement, protocols for measuring the 3D parameters
of any lattice type in this way. In the case of crystals with
cell side greater than twice the continuous transfer limit, we
show that orthogonal +/-15 and +/-10 degree tilt ranges may allow
one to measure 3D parameters of all cubic nanocrystal varieties
in a specimen from only two well-chosen images. The strategy is
illustrated by measuring the lattice parameters of a 10nm
WC_{1-x} crystal in a plasma-enhanced chemical-vapor deposited
thin film.
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