Selected References from the UM-StL Scanned Tip and Electron Image Lab

URL< http://newton.umsl.edu/STEI/reference/reference.html>
Last updated on March 25, 1996
Please write our lab for a copy of any of the papers/abstracts listed here.

1989

``Stardust in the TEM'' by P. Fraundorf
Ultramicroscopy 27, 9 (1989) p401-412.

1990

``Localizing periodicity in near-field images'' by P. Fraundorf,
cond-mat/9711309 (xxx.lanl.gov archives, Los Alamos, NM);
Physical Review Letters 64, 9 (1990) p 1031, 1032, 1033, 1034.

1991

``The instrument response function in air-based scanning tunneling microscopy''
by P. Fraundorf and J. Tentschert
physics/9712003 (xxx.lanl.gov archives, Los Alamos, NM);
Ultramicroscopy 37 (1991) p 125, 126, 127, 128, 129.

1992

1993

  • "Log-log scale roughness spectroscopy of surfaces"
    P. Fraundorf and B. Armbruster
    Proc. 51st Annual Meeting of the Microscopy Society of America (San Francisco Press, 1993) p224-225.

  • "Distortion in lattice-resolution scanned-probe microscope images"
    L. Fei
    Proc. 51st Annual Meeting of the Microscopy Society of America (San Francisco Press, 1993) p522-523.

  • "Finding noise-related artifacts in scanned-probe microscope images"
    H. Siriwardane, P. Fraundorf, L. Fei, W. J. James, J. Newkirk, and O. A. Pringle
    Proc. 51st Annual Meeting of the Microscopy Society of America (San Francisco Press, 1993) p524-525.

  • "In-situ measurements of scanned probe tip shape with etched nuclear tracks"
    J. Tenschert, P. Fraundorf and B. Armbruster
    Proc. 51st Annual Meeting of the Microscopy Society of America (San Francisco Press, 1993) p528-529.

  • "Scanned-probe microscope roughness spectroscopy"
    P. Fraundorf and B. Armbruster
    Proc. 51st Annual Meeting of the Microscopy Society of America (San Francisco Press, 1993) p530-531.

  • "Scanned tip measurement of deep vertical facets on a flat surface: Measuring roughness on GaAs LASER waveguide mirrors"
    Chang Shen, Phil Fraundorf, and Robert W. Harrick
    Proc. 51st Annual Meeting of the Microscopy Society of America (San Francisco Press, 1993) p532-533.

  • "Lateral displacement microscopy of holograms using scanned tip image pairs"
    C. Shen and P. Fraundorf
    Proc. 51st Annual Meeting of the Microscopy Society of America (San Francisco Press, 1993) p534-535.

  • "Bayesian removal of noise for increased sensitivity in vector pattern recognition lattice imaging of interfaces"
    L. Fei and P. Fraundorf
    Proc. 51st Annual Meeting of the Microscopy Society of America (San Francisco Press, 1993) p994-995.

    1994

  • "Arms (One vs Two) and the Physicist"
    P. Fraundorf
    Physics Today 47(8), pp.14-15, (August, 1994)

  • "Microstructure and physical properties of plasma-enhenced chemical vapor deposited iron carbide films"
    H. Siriwardane, P. Fraundorf, O. A. Pringle, W. J. James, and J. W. Newkirk
    APS March Meeting '95 (12/1/94).
    For a postscript version of the abstract, click here, 22,171 bytes.

  • "In situ monioring scanned probe tip shape using nuclear track pits"
    J. Tentschert, L. Fei, H. Siriwardane, and P. Fraundorf
    Revising for Journal of Vacuum Science and Technology (12/20/94)
    For a postscript version of the preprint, click here, 2,466,668 bytes.

  • "Scanning force microscopy of lattice steps and native oxide nucleation on epiaxial Si(001) in air"
    L. Fei, P. Fraundorf and I. J. Malik
    In preparation.

  • "Lateral displacement microscopy of holograms using scanned probe microscopy image pairs"
    C. Shen and P. Fraundorf
    In preparation.

    1995

  • "Scanning Force Microscope Z-Calibration Using Steps on Chemically Etched Mica"
    L. Fei and P. Fraundorf
    JMSA Proceedings Microscopy and MicroAnalysis 1995 (Jones & Begell, NY 1995) p204-205.

  • "Evidence for a Raised Rim on Pits in Mica Induced by keV/Nucleon Ions"
    L. Fei and P. Fraundorf
    JMSA Proceedings Microscopy and MicroAnalysis 1995 (Jones & Begell, NY 1995) p390-391.

  • "Correlation of Defect Densities in Semiconductors measured by TEM and optical profiling instruments"
    L. Mulestagno, J. C. Holzer, D. E. Hill and P. Fraundorf
    JMSA Proceedings Microscopy and MicroAnalysis 1995 (Jones & Begell, NY 1995) p446-447.

  • "TEM Study of Bonded Silicon Wafers"
    L. Mulestagno, R. Craven and P. Fraundorf
    JMSA Proceedings Microscopy and MicroAnalysis 1995 (Jones & Begell, NY 1995) p460-461.

  • "Quantitative Defect Studies in Semiconductor TEM Samples prepared by Low Angle Ion Milling"
    L. Mulestagno, J. C. Holzer, and P. Fraundorf
    JMSA Proceedings Microscopy and MicroAnalysis 1995 (Jones & Begell, NY 1995) p512-513.

  • "Microstructure of Plasma-Deposited Iron-Nitride Films"
    H. Siriwardane, C. Polly, A. Sago, P. Fraundorf, O. A. Pringle,
    J. W. Newkirk, and W. J. James
    JMSA Proceedings Microscopy and MicroAnalysis 1995 (Jones & Begell, NY 1995) p556-557.

  • "Capacitance Imaging with a Scanning Force Microscope"
    R. Anderson, H. Siriwardane, P. Fraundorf and T. Stivers
    JMSA Proceedings Microscopy and MicroAnalysis 1995 (Jones & Begell, NY 1995) p730-731.

    1996

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