UM-StL Scanned Tip and Electron Image Lab
[New]
[Overview]
[Index]
[Images]
[Research]
[Fires]
[Facilities]
[Who Now]
[Who Else]
[Papers]
[Sites]
[Mail]
New:
What is direct-space crystallography via stereo lattice imaging [hint]? More on this soon...
Draft (p1,2; PDF) of Wentao's paper for the 1999 Microscope Society of America Conference.
In Winter 1999, both weekend SEM (p307), and Bio-EM (b392), courses will be offered!
The TEM course this Fall 1998 (Phys 308) now has 2 sections. Stop by for a visit in M101!
Check out our Engleman workshop on using flashbacks to save a mars-mission crew.
Check out our microscopy course overview, as well as sem, tem and spm course pages.
Draft description of a possible summer workshop series targeted toward analytical service clients rather than operators.
The complex-color view below of quantum-mechanical tunnelling with standing wave on the left, barrier in the middle, and a wave past the barrier on the right is much more compact than the complex-plane animation of the same process. The latter, of course, is not even an option when it comes to viewing complex images, such as 2D Fourier transforms or optical wave-field cross-sections!
Selected images from "Play and Work in the NanoWorlds of St. Louis".
Nuclei recoil on alpha-decay, creating etchable damage tracks in mica.
Check out the reciprocal world course stuff in prep for next semester.
Searching with IR for 200nm defects in silicon? Lucio's 1.8MB review note in PDF is here.
We now have on-line group-meeting servers like this one here. Write pf for login details.
One image from a 3D series of HREM images of Tungsten Carbide/Oxide Crystals by Wentao Qin.
Three abstracts for the Winter 1998 AAPT Conference.
Our CME page & some nature nanophotography.
If you do VRML, nano-visit the 0.6MB surface of a polymer decorated by Kevin Saff.
Tabletop tip vibrations are less than 0.07 nm on the 250-ton slab in our new "triple bi-story" CME site!
Try two-ton TEM turnovers today?
Dave's materials astronomy note on presolar red-giant graphite-onion core/diameter ratios.
Check out deBroglie's electrons & some odd TEM facts.
Try hand at focussing and astigmating a high resolution electron microscope.
Last modified on Nov 23, 1998. Section(s) modified:
1
To list some current outside web-links which point in to the scanned tip and electron image lab stuff at this site...
Wuzzle: If this is what reciprocal space looks like, switching to direct space finds what? If you do VRML, hike the 182kB reciprocal-lattice of this mystery crystal for clues.
Puzzler: What is this a HREM image of? Hint: 10-fold Scattering Centers Orthorhombically Arrayed
in an Image 64 Angstroms wide!
Phyzzlers: What does Coulomb's law have to do with the "line of no contrast" in TEM images of tiny defects in crystals?
Check out this charge visualization to find out.
Note: This page contains original material. If you choose to echo in print or
on the web, permission from us (as well as a citation) may be appropriate.
{ Thanks. /philf :) }
OVERVIEW
This lab began as the UM-StL component of the St. Louis Consortium for
Microstructural Studies in the late 1980's, and continues that Consortium's
objective of developing and offering advanced techniques for "getting small",
and doing microscopic detective work on materials in the size range between
microns and atoms. This lab brought the first scanning probe microscopes
(tunneling and force) to the area, and continues to manage the only
atom-resolution (sub-2A point to point) transmission electron microscope
facility in Missouri. Always part of a regional "Center without Walls", it is
also the operating unit of the UM-StL Center for
Molecular Electronics' Microstructural Studies
Facility most directly linked to present and prospective Industry
Sponsorships for the Center.
- Overview
- Image(s) of the month
- Long Term Projects
- Fire-Fighting Projects
- Facilities
- Immediate Members of the Group
- Non-local or Previous Members of the Group
- Recent Papers and/or Abstracts
- Other Interesting Microscopy Sites
- mail to author(s)
Microscope Acronyms: AFM=contact repulsive force; TM=tapping mode force;
STM=scanning tunneling; HREM=electron phase contrast TEM; CTEM=conventional TEM.
1996
| Feb'96 |   | Simulated lateral displacement image of a soft cosine ripple (AFM), and some intergrown hemispherical bumps (air-STM).{CS,PF} |
| Jan'96 |   | HREM showing 2D graphite starflakes in the core of a micron-sized presolar graphite onion, likely carried to us on the backs of photons from the near-surface of a carbon-rich red giant.{KB,DD,QW,PF} |
1995
| Dec'95 |  | Raw STM image of a gold/palladium(Au/Pd)-on-graphite specimen in air, showing what may be Au/Pd clustering on a carbon atom lattice.{QW,CS} |
| Nov'95 |  | CTEM of oxygen precipitates (& related defects) in VLSI silicon after 2^n hours growth, for comparison with infrared laser scattering profiles.{LM} |
| Oct'95 |  | TM_AFM images of 0.13 nm Steps on "fresh-epitaxial" (100) Silicon in air.{LF} |
| Sep'95 |  | AFM video of an integrated circuit memory chip, with micron-sized cube for scale.{RA} |
| Aug'95 |  | AFM micrographs of sickle cell platelets provided by the microscopist.{RA} |
| Jul '95 |  | TM_AFM images, with many field-widths for roughness spectroscopy, of widely-spaced atomic steps on (100) silicon in air.{LF} |
| Jun'95 |  | Simulated HREM images of randomly-oriented atom-thick graphite flakes, suggesting in direct space the remarkable features of diffraction from 2D crystals.{KB,PF} |
| May'95 |  | "Nano-wheat" in some "nano-valleys", or water on mica?{LF} |
| Apr'95 |  | An etched nuclear particle track in mica, probably from natural fission of uranium contained therein.{LF} |
| Mar'95 |  | HREM of ordered icosahedra in annealed TiMn quasicrystal, shown in 10-fold symmetry down P2(001).{LL,PF} |
| Feb'95 |  | Some strange rimmed pits in argon-irradiated mica, only a molecule or so deep (and high) but 10nm wide!{LF} |
| Jan'95 |  | Playing "Where's Crystaldo" with Bayesian background subtraction of noise from images.{JT,LF,PF} |
Images of Months Past
- People: Analytical Support and Research
- Stuff: Materials of Interest
- Instruments: Experimental Techniques/Methods
- Data: Inference, Statistical and Otherwise
- Bayesian Background Subtraction
- Roughness Spectroscopy
- Electron Phase Contrast Focus & Astigmate
(EPCfocus) - The
Arcade Game?
- Inverting Pit Profiles to get Tip Shape Envelopes and Touch Maps
- Single Crystal Analysis of Selected Area Electron Diffraction Patterns
(SXTL)
- Azimuthal Averaging of Electron Diffraction Patterns
- Study of Mineral Nanoparticles for Magnetic Resonance Imaging
- Quantifying the Optical Precipitate Profiling of Defects in VLSI Silicon
- Scanned Probe Microscopy of Conductive Polymers
Philips EM430ST 300 kV high resolution/analytical transmission electron microscope (TEM), with sub-2A point-resolution pole-piece, STEM system, double-tilt low-blank stages, Gatan electron energy loss (EELS) spectrometer, and EDAX thin window energy-dispersive X-ray (EDS) detector.
Digital Instruments NanoScope III multimode scanning probe
microscope (STM, AFM, LFM, TMFM, ECSTM, ECAFM)
Cambridge S240 scanning electron microscope (SEM) with Link X-ray system
Cambridge Stereoscan 250 scanning electron microscope with Tracor X-ray system
(soon we hope) Hitachi H-600 100kV transmission electron microscope
Digital Instruments Nanoscope I scanning tunneling microscope
Specimen preparation equipment: vacuum evaporator, wafering saw, disc cutter,
dimpler and ion mill, tripod polisher, sputter coater
Sun Sparc I & II workstations
Access to several Silicon Graphics, Dec, and Vax Workstations
MS-DOS computers with clock speeds >200MHz and as much as 128MB memory
MacIntosh IIx computer
Hewlett Packard ScanJet IIc scanner
640x480x8 bits image digitizer
Mitsubishi Color Video Copy Processor
Codonics np1600 graphic network color printer with postscript option
Hewlett Packard LaserJet III printer with postscript cartridge
Hewlett Packard DeskJet 870Cse color printer
Synoptics Semper 6.2 image processing sofrware package and board
- Anderson, Richard (Graduate)
- Dawkins, David (Graduate)
- Fei, Lu (Ph.D. '96, UM-StL)
- Fraundorf, Philip (Associate Professor,
Ph.D. '80, Washington U.)
- Gharabagi, Roobik (Visiting Professor, SLU Electrical Engineering)
- Gray, Aaron (Graduate)
- Lin, Shuhan (Staff)
- McGill, Darren (Englemann)
- Mule'stagno, Luciano (Adjunct Professor, Ph.D. '96, UM-StL)
- Qin, Wentao (Graduate)
- Saff, Kevin (Englemann)
- Schuler, Richard (Graduate)
- Shen, Chang (Ph.D. '98, UM-StL)
- Siriwardane, Haresh (Adjunct Professor, Ph.D. '93, UM-Rolla)
- Tronh, Minh (UnderGraduate)
- Turner, Kevin (Graduate)
- Armbruster, Barbara (Gatan, Inc.)
- Baugh, Fred (Graduate)
- Brewer, Kay (Undergraduate, Indiana University-Bloomington)
- Fedak, Russell (St. Louis)
- Lieubecki, Gneiwko (Boston)
- Maddenn, Barrett
- Nellesen, Pat (Graduate)
- Pollack, Kurt (Minneapolis)
- Tentschert, Jeff (Houston)
- Tucker, Jennifer
- Yao, Ji
This URL is: http://newton.umsl.edu/stei_lab/
Rooms CME106-115, UM-StL Center for Molecular Electronics Building,
Benton Drive, North Campus,
University
of Missouri-St. Louis,
St. Louis, Missouri,
USA
UM-StL connections: Physics & Astronomy,
Center for Molecular Electronics,
Information Physics,
Computer Programs,
Acceleration One,
and
Wuzzlers.
PHONE:(314)-516-5024, FAX:(314)-516-6152, ZIP:63121-4499
Between late 1994 and July 1996, the access log for this page shows 3326 visits.
Since 1 August 1996, you are visitor number
.
Send comments and/or complaints to
lufei@newton.umsl.edu or
pfraundorf@umsl.edu.